Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy
In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods prop...
Gardado en:
| Principais autores: | , , |
|---|---|
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Beilstein-Institut
2012-03-01
|
| Series: | Beilstein Journal of Nanotechnology |
| Assuntos: | |
| Acceso en liña: | https://doi.org/10.3762/bjnano.3.27 |
| Tags: |
Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!
|