Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy
In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods prop...
שמור ב:
| Principais autores: | , , |
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| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Beilstein-Institut
2012-03-01
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| סדרה: | Beilstein Journal of Nanotechnology |
| נושאים: | |
| גישה מקוונת: | https://doi.org/10.3762/bjnano.3.27 |
| תגים: |
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