Determining amplitude and tilt of a lateral force microscopy sensor
In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the osci...
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| Autori principali: | , , , , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Beilstein-Institut
2021-06-01
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| Serie: | Beilstein Journal of Nanotechnology |
| Soggetti: | |
| Accesso online: | https://doi.org/10.3762/bjnano.12.42 |
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