An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection
Wafer surface defect detection is a critical component in the chip manufacturing process. To address the shortcomings of manual inspection and the limitations of existing machine learning methods, this paper proposes a wafer defect detection algorithm based on an improved YOLOv7-tiny. First, a coord...
Sábháilte in:
| Príomhchruthaitheoirí: | , , , |
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| Formáid: | Artigo |
| Teanga: | Inglês |
| Foilsithe / Cruthaithe: |
IEEE
2025-01-01
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| Sraith: | IEEE Access |
| Ábhair: | |
| Rochtain ar líne: | https://ieeexplore.ieee.org/document/10836686/ |
| Clibeanna: |
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
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