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Electrical Effect of Nitrogen Implanted Into LDD of MOSFETs

The motivation of this study was to solve the high <inline-formula> <tex-math notation="LaTeX">$\rm I_{D,off}$ </tex-math></inline-formula> problem in 8 Volt N-channel MOSFET. We experimented with implanting nitrogen into LDD at various doses. As a result, <inline-formula> <tex-math notation="LaTeX"...

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Bibliografische Detailangaben
Hauptverfasser: Yoo Seon Song, Markus Lenski, Mohammed F. Karim, Keith Flynn, Jan Hoentschel, Carsten Peters, Jens-Uwe Sachse, Omur Isil Aydin, Jun Wu, Bastian Hausdorfer, Mahesh Siddabathula, Konrad Semmler, Jurgen Daleiden
Format: Artigo
Sprache:Inglês
Veröffentlicht: IEEE 2024-01-01
Schriftenreihe:IEEE Journal of the Electron Devices Society
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Online-Zugang:https://ieeexplore.ieee.org/document/10634165/
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