Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS

This paper presents an extensive characterization of the low-frequency noise (LFN) at room temperature (RT) and cryogenic temperature (4.2K) of 40-nm bulk-CMOS transistors. The noise is measured over a wide range of bias conditions and geometries to generate a comprehensive overview of LFN in this t...

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Xehetasun bibliografikoak
Egile Nagusiak:	Gerd Kiene, Sadik Ilik, Luigi Mastrodomenico, Masoud Babaie, Fabio Sebastiano
Formatua:	Artigo
Hizkuntza:	Inglês
Argitaratua:	IEEE 2024-01-01
Saila:	IEEE Journal of the Electron Devices Society
Gaiak:	Low frequency noise 1/f noise flicker noise cryogenic electronics Cryo-CMOS quantum computing
Sarrera elektronikoa:	https://ieeexplore.ieee.org/document/10606256/
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS

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