Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS

This paper presents an extensive characterization of the low-frequency noise (LFN) at room temperature (RT) and cryogenic temperature (4.2K) of 40-nm bulk-CMOS transistors. The noise is measured over a wide range of bias conditions and geometries to generate a comprehensive overview of LFN in this t...

全面介紹

書目詳細資料

Principais autores:	Gerd Kiene, Sadik Ilik, Luigi Mastrodomenico, Masoud Babaie, Fabio Sebastiano
格式:	Artigo
語言:	Inglês
出版:	IEEE 2024-01-01
叢編:	IEEE Journal of the Electron Devices Society
主題:	Low frequency noise 1/f noise flicker noise cryogenic electronics Cryo-CMOS quantum computing
在線閱讀:	https://ieeexplore.ieee.org/document/10606256/
標簽:	添加標簽 沒有標簽, 成為第一個標記此記錄!