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High-Precision Wafer Bonding Alignment Mark Using Moiré Fringes and Digital Grating

This paper investigates a moiré-based mark for high-precision wafer bonding alignment. During alignment, the mark is combined with digital grating, which has the benefits of high precision and small size. A digital grating is superimposed on the mark to generate moiré fringes. By performing a phase...

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Détails bibliographiques
Auteurs principaux: Jianhan Fan, Sen Lu, Jianxiao Zou, Kaiming Yang, Yu Zhu, Kaiji Liao
Format: Artigo
Langue:Inglês
Publié: MDPI AG 2022-12-01
Collection:Micromachines
Sujets:
Accès en ligne:https://www.mdpi.com/2072-666X/13/12/2159
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