An Improved YOLOv8 Detection Algorithm Based on Screen Printing Defect Images
Micro-defects, such as ink spots, scratches, and sintering formed during the screen printing process of photovoltaic cells, significantly impair module performance. Traditional machine vision methods exhibit limited detection efficiency and high false-positive and missed-detection rates, while exist...
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| Hoofdauteurs: | , , , , , , , , , |
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| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
MDPI AG
2026-03-01
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| Reeks: | Sensors |
| Onderwerpen: | |
| Online toegang: | https://www.mdpi.com/1424-8220/26/5/1604 |
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