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An Improved YOLOv8 Detection Algorithm Based on Screen Printing Defect Images

Micro-defects, such as ink spots, scratches, and sintering formed during the screen printing process of photovoltaic cells, significantly impair module performance. Traditional machine vision methods exhibit limited detection efficiency and high false-positive and missed-detection rates, while exist...

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Tallennettuna:
Päätekijät: Shuqin Wu, Xinru Dong, Qiang Da, Meiou Wang, Yuxuan Sun, Ge Ge, Jinge Ma, Jiajie Kang, Yu Yao, Shubo Shi
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: MDPI AG 2026-03-01
Sarja:Sensors
Aiheet:
YOLOv8
screen printing defect
detection
deep learning
machine vision
Linkit:https://www.mdpi.com/1424-8220/26/5/1604
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