An Improved YOLOv8 Detection Algorithm Based on Screen Printing Defect Images

Micro-defects, such as ink spots, scratches, and sintering formed during the screen printing process of photovoltaic cells, significantly impair module performance. Traditional machine vision methods exhibit limited detection efficiency and high false-positive and missed-detection rates, while exist...

पूर्ण विवरण

ग्रंथसूची विवरण

मुख्य लेखकों:	Shuqin Wu, Xinru Dong, Qiang Da, Meiou Wang, Yuxuan Sun, Ge Ge, Jinge Ma, Jiajie Kang, Yu Yao, Shubo Shi
स्वरूप:	Artigo
भाषा:	Inglês
प्रकाशित:	MDPI AG 2026-03-01
श्रृंखला:	Sensors
विषय:	YOLOv8 screen printing defect detection deep learning machine vision
ऑनलाइन पहुंच:	https://www.mdpi.com/1424-8220/26/5/1604
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