An Improved YOLOv8 Detection Algorithm Based on Screen Printing Defect Images

Micro-defects, such as ink spots, scratches, and sintering formed during the screen printing process of photovoltaic cells, significantly impair module performance. Traditional machine vision methods exhibit limited detection efficiency and high false-positive and missed-detection rates, while exist...

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Номзүйн дэлгэрэнгүй

Үндсэн зохиолчид:	Shuqin Wu, Xinru Dong, Qiang Da, Meiou Wang, Yuxuan Sun, Ge Ge, Jinge Ma, Jiajie Kang, Yu Yao, Shubo Shi
Формат:	Artigo
Хэл сонгох:	Inglês
Хэвлэсэн:	MDPI AG 2026-03-01
Цуврал:	Sensors
Нөхцлүүд:	YOLOv8 screen printing defect detection deep learning machine vision
Онлайн хандалт:	https://www.mdpi.com/1424-8220/26/5/1604
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!