Local field effect on charge-capture/emission dynamics

od Cheung, Kin P., Veksler, Dmitry, Campbell, Jason P.
Izdano u IEEE Trans Electron Devices (2017)

Nanoscale MOSFET as a Potential Room-Temperature Quantum Current Source

od Cheung, Kin P., Wang, Chen, Campbell, Jason P.
Izdano u Micromachines (Basel) (2020)

Ferroelectricity in Polar Polymer-based FETs: A Hysteresis Analysis

od Georgiou, Vasileia, Veksler, Dmitry, Campbell, Jason P., Shrestha, Pragya R., Ryan, Jason T., Ioannou, Dimitris E., Cheung, Kin P.
Izdano u Adv Funct Mater (2018)

Rapid and Accurate C-V Measurements

od Kim, Ji-Hong, Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Nminibapiel, David, Kopanski, Joseph J., Cheung, Kin P.
Izdano u IEEE Trans Electron Devices (2016)

Impact of RRAM Read Fluctuations on the Program-Verify Approach

od Nminibapiel, David M., Veksler, Dmitry, Kim, J.-H., Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Baumgart, Helmut, Cheung, Kin. P.
Izdano u IEEE Electron Device Lett (2017)

Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station

od McCrory, Duane J., Anders, Mark A., Ryan, Jason T., Shrestha, Pragya R., Cheung, Kin P., Lenahan, Patrick M., Campbell, Jason P.
Izdano u IEEE Trans Device Mater Reliab (2018)

Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station

od McCrory, Duane J., Anders, Mark A., Ryan, Jason T., Shrestha, Pragya R., Cheung, Kin P., Lenahan, Patrick M., Campbell, Jason P.
Izdano u Rev Sci Instrum (2019)

Observation of Strong Reflection of Electron Waves Exiting a Ballistic Channel at Low Energy

od Vaz, Canute I., Liu, Changze, Campbell, Jason P., Ryan, Jason T., Southwick, Richard G., Gundlach, David, Oates, Anthony S., Huang, Ru, Cheung, Kin. P.
Izdano u AIP Adv (2016)