Local field effect on charge-capture/emission dynamics

מאת Cheung, Kin P., Veksler, Dmitry, Campbell, Jason P.
הוצא לאור ב IEEE Trans Electron Devices (2017)

Nanoscale MOSFET as a Potential Room-Temperature Quantum Current Source

מאת Cheung, Kin P., Wang, Chen, Campbell, Jason P.
הוצא לאור ב Micromachines (Basel) (2020)

Ferroelectricity in Polar Polymer-based FETs: A Hysteresis Analysis

מאת Georgiou, Vasileia, Veksler, Dmitry, Campbell, Jason P., Shrestha, Pragya R., Ryan, Jason T., Ioannou, Dimitris E., Cheung, Kin P.
הוצא לאור ב Adv Funct Mater (2018)

Rapid and Accurate C-V Measurements

מאת Kim, Ji-Hong, Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Nminibapiel, David, Kopanski, Joseph J., Cheung, Kin P.
הוצא לאור ב IEEE Trans Electron Devices (2016)

Impact of RRAM Read Fluctuations on the Program-Verify Approach

מאת Nminibapiel, David M., Veksler, Dmitry, Kim, J.-H., Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Baumgart, Helmut, Cheung, Kin. P.
הוצא לאור ב IEEE Electron Device Lett (2017)

Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station

מאת McCrory, Duane J., Anders, Mark A., Ryan, Jason T., Shrestha, Pragya R., Cheung, Kin P., Lenahan, Patrick M., Campbell, Jason P.
הוצא לאור ב IEEE Trans Device Mater Reliab (2018)

Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station

מאת McCrory, Duane J., Anders, Mark A., Ryan, Jason T., Shrestha, Pragya R., Cheung, Kin P., Lenahan, Patrick M., Campbell, Jason P.
הוצא לאור ב Rev Sci Instrum (2019)

Observation of Strong Reflection of Electron Waves Exiting a Ballistic Channel at Low Energy

מאת Vaz, Canute I., Liu, Changze, Campbell, Jason P., Ryan, Jason T., Southwick, Richard G., Gundlach, David, Oates, Anthony S., Huang, Ru, Cheung, Kin. P.
הוצא לאור ב AIP Adv (2016)