Local field effect on charge-capture/emission dynamics

por Cheung, Kin P., Veksler, Dmitry, Campbell, Jason P.
Publicado en IEEE Trans Electron Devices (2017)

Nanoscale MOSFET as a Potential Room-Temperature Quantum Current Source

por Cheung, Kin P., Wang, Chen, Campbell, Jason P.
Publicado en Micromachines (Basel) (2020)

Ferroelectricity in Polar Polymer-based FETs: A Hysteresis Analysis

por Georgiou, Vasileia, Veksler, Dmitry, Campbell, Jason P., Shrestha, Pragya R., Ryan, Jason T., Ioannou, Dimitris E., Cheung, Kin P.
Publicado en Adv Funct Mater (2018)

Rapid and Accurate C-V Measurements

por Kim, Ji-Hong, Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Nminibapiel, David, Kopanski, Joseph J., Cheung, Kin P.
Publicado en IEEE Trans Electron Devices (2016)

Impact of RRAM Read Fluctuations on the Program-Verify Approach

por Nminibapiel, David M., Veksler, Dmitry, Kim, J.-H., Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Baumgart, Helmut, Cheung, Kin. P.
Publicado en IEEE Electron Device Lett (2017)

Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station

por McCrory, Duane J., Anders, Mark A., Ryan, Jason T., Shrestha, Pragya R., Cheung, Kin P., Lenahan, Patrick M., Campbell, Jason P.
Publicado en IEEE Trans Device Mater Reliab (2018)

Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station

por McCrory, Duane J., Anders, Mark A., Ryan, Jason T., Shrestha, Pragya R., Cheung, Kin P., Lenahan, Patrick M., Campbell, Jason P.
Publicado en Rev Sci Instrum (2019)

Observation of Strong Reflection of Electron Waves Exiting a Ballistic Channel at Low Energy

por Vaz, Canute I., Liu, Changze, Campbell, Jason P., Ryan, Jason T., Southwick, Richard G., Gundlach, David, Oates, Anthony S., Huang, Ru, Cheung, Kin. P.
Publicado en AIP Adv (2016)