Optical and structural characterization ot the heterostructure CdTe/GaAs grown by RF sputtering
We present the results of the characterization of CdTe thin films grown by radio frequency sputtering employing GaAs substrates subject to different chemical cleaning procedures. The objective of this work is to study the effect of GaAs fresh oxides on the properties of CdTe films. The three differe...
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| Veröffentlicht in: | Superficies y vacío |
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| Hauptverfasser: | , , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
1999
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| Schlagworte: | |
| Online-Zugang: | https://www.redalyc.org/articulo.oa?id=94211324019 |
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