The formation of CdTe thin films by the stacked elemental layer method
Cadmium telluride thin films have been produced using the Stacked Elemental Layer technique. The films were characterized using x-ray diffraction, optical transmittance and reflectance, and atomic force microscopy. The evolution of the thin film reaction and compound formation were studied using x-r...
שמור ב:
| הוצא לאור ב: | Superficies y vacío |
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| Principais autores: | , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
1999
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| נושאים: | |
| גישה מקוונת: | https://www.redalyc.org/articulo.oa?id=94200924 |
| תגים: |
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