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The formation of CdTe thin films by the stacked elemental layer method

Cadmium telluride thin films have been produced using the Stacked Elemental Layer technique. The films were characterized using x-ray diffraction, optical transmittance and reflectance, and atomic force microscopy. The evolution of the thin film reaction and compound formation were studied using x-r...

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Shranjeno v:
Bibliografske podrobnosti
izdano v:Superficies y vacío
Principais autores: L.R. Cruz, R.R. de Avillez
Format: Artigo
Jezik:Inglês
Izdano: Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C. 1999
Teme:
Online dostop:https://www.redalyc.org/articulo.oa?id=94200924
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