The formation of CdTe thin films by the stacked elemental layer method
Cadmium telluride thin films have been produced using the Stacked Elemental Layer technique. The films were characterized using x-ray diffraction, optical transmittance and reflectance, and atomic force microscopy. The evolution of the thin film reaction and compound formation were studied using x-r...
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| Vydáno v: | Superficies y vacío |
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| Hlavní autoři: | , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
1999
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| Témata: | |
| On-line přístup: | https://www.redalyc.org/articulo.oa?id=94200924 |
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