Resolución atómica de elementos ligeros utilizando HAADF y ABF-STEM con corrección de Cs y bajo voltaje
Scanning transmission electron microscopy (STEM) can give structural and chemical information down to 0.1 nm of spatial resolution, which sub–angstrom resolution is achieved with a spherical aberration corrector for the probe. In the STEM, the electron probe is focused and scanned over the sample an...
Tallennettuna:
| Julkaisussa: | Mundo Nano |
|---|---|
| Päätekijä: | |
| Aineistotyyppi: | Artigo |
| Kieli: | Espanhol |
| Julkaistu: |
Universidad Nacional Autónoma de México
2020
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| Aiheet: | |
| Linkit: | https://www.redalyc.org/articulo.oa?id=757781195004 |
| Tagit: |
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