Resolución atómica de elementos ligeros utilizando HAADF y ABF-STEM con corrección de Cs y bajo voltaje
Scanning transmission electron microscopy (STEM) can give structural and chemical information down to 0.1 nm of spatial resolution, which sub–angstrom resolution is achieved with a spherical aberration corrector for the probe. In the STEM, the electron probe is focused and scanned over the sample an...
Wedi'i Gadw mewn:
| Cyhoeddwyd yn: | Mundo Nano |
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| Prif Awdur: | |
| Fformat: | Artigo |
| Iaith: | Espanhol |
| Cyhoeddwyd: |
Universidad Nacional Autónoma de México
2020
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| Pynciau: | |
| Mynediad Ar-lein: | https://www.redalyc.org/articulo.oa?id=757781195004 |
| Tagiau: |
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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