Resolución atómica de elementos ligeros utilizando HAADF y ABF-STEM con corrección de Cs y bajo voltaje
Scanning transmission electron microscopy (STEM) can give structural and chemical information down to 0.1 nm of spatial resolution, which sub–angstrom resolution is achieved with a spherical aberration corrector for the probe. In the STEM, the electron probe is focused and scanned over the sample an...
-д хадгалсан:
| -д хэвлэсэн: | Mundo Nano |
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| Үндсэн зохиолч: | |
| Формат: | Artigo |
| Хэл сонгох: | Espanhol |
| Хэвлэсэн: |
Universidad Nacional Autónoma de México
2020
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| Нөхцлүүд: | |
| Онлайн хандалт: | https://www.redalyc.org/articulo.oa?id=757781195004 |
| Шошгууд: |
Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
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