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Image processing metrics for phase identification of a multiaxis MEMS scanner used in single pixel imaging
This paper applies image processing metrics to tracking of perturbations in mechanical phase delay in a multi-axis microelectromechanical system (MEMS) scanner. The compact mirror is designed to scan a laser beam in a Lissajous pattern during the collection of endoscopic confocal fluorescence images...
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| Gepubliceerd in: | IEEE ASME Trans Mechatron |
|---|---|
| Hoofdauteurs: | , , , , , , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
2020
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8293905/ https://ncbi.nlm.nih.gov/pubmed/34295138 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/tmech.2020.3020923 |
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