Carregant...
Image processing metrics for phase identification of a multiaxis MEMS scanner used in single pixel imaging
This paper applies image processing metrics to tracking of perturbations in mechanical phase delay in a multi-axis microelectromechanical system (MEMS) scanner. The compact mirror is designed to scan a laser beam in a Lissajous pattern during the collection of endoscopic confocal fluorescence images...
Guardat en:
| Publicat a: | IEEE ASME Trans Mechatron |
|---|---|
| Autors principals: | , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
2020
|
| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8293905/ https://ncbi.nlm.nih.gov/pubmed/34295138 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/tmech.2020.3020923 |
| Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|