Birla, M., Duan, X., Li, H., Lee, M., Li, G., Wang, T., & Oldham, K. (2020). Image processing metrics for phase identification of a multiaxis MEMS scanner used in single pixel imaging. IEEE ASME Trans Mechatron.
Chicago Style CitationBirla, Mayur, Xiyu Duan, Haijun Li, Miki Lee, Gaoming Li, Thomas Wang, i Kenn Oldham. "Image Processing Metrics for Phase Identification of a Multiaxis MEMS Scanner Used in Single Pixel Imaging." IEEE ASME Trans Mechatron 2020.
Cita MLABirla, Mayur, et al. "Image Processing Metrics for Phase Identification of a Multiaxis MEMS Scanner Used in Single Pixel Imaging." IEEE ASME Trans Mechatron 2020.
Atenció: Aquestes cites poden no estar 100% correctes.