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Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications
Neuromorphic systems require integrated structures with high-density memory and selector devices to avoid interference and recognition errors between neighboring memory cells. To improve the performance of a selector device, it is important to understand the characteristics of the switching process....
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| Published in: | Appl Microsc |
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| Main Authors: | , , , , |
| Format: | Artigo |
| Language: | Inglês |
| Published: |
Springer Singapore
2021
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| Subjects: | |
| Online Access: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8155164/ https://ncbi.nlm.nih.gov/pubmed/34037869 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s42649-021-00056-9 |
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