Kim, Y., Lee, J., Jeon, D., Oh, S., & Yeo, J. (2021). Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications. Appl Microsc.
Citación estilo ChicagoKim, Young-Min, Jihye Lee, Deok-Jin Jeon, Si-Eun Oh, and Jong-Souk Yeo. "Advanced Atomic Force Microscopy-based Techniques for Nanoscale Characterization of Switching Devices for Emerging Neuromorphic Applications." Appl Microsc 2021.
Cita MLAKim, Young-Min, et al. "Advanced Atomic Force Microscopy-based Techniques for Nanoscale Characterization of Switching Devices for Emerging Neuromorphic Applications." Appl Microsc 2021.
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