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Exploring wear at the nanoscale with circular mode atomic force microscopy

The development of atomic force microscopy (AFM) has allowed wear mechanisms to be investigated at the nanometer scale by means of a single asperity contact generated by an AFM tip and an interacting surface. However, the low wear rate at the nanoscale and the thermal drift require fastidious quanti...

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Detalhes bibliográficos
Publicado no:Beilstein J Nanotechnol
Main Authors: Noel, Olivier, Vencl, Aleksandar, Mazeran, Pierre-Emmanuel
Formato: Artigo
Idioma:Inglês
Publicado em: Beilstein-Institut 2017
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5753049/
https://ncbi.nlm.nih.gov/pubmed/29354338
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.8.266
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