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Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy
Dynamic atomic force microscopy (AFM) was employed to spatially map the elastic modulus of highly oriented pyrolytic graphite (HOPG), specifically by using force modulation microscopy (FMM) and contact resonance (CR) AFM. In both of these techniques, a variation in the amplitude signal was observed...
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| Publicado no: | Beilstein J Nanotechnol |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6633814/ https://ncbi.nlm.nih.gov/pubmed/31355102 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.10.132 |
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