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Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy
Dynamic atomic force microscopy (AFM) was employed to spatially map the elastic modulus of highly oriented pyrolytic graphite (HOPG), specifically by using force modulation microscopy (FMM) and contact resonance (CR) AFM. In both of these techniques, a variation in the amplitude signal was observed...
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| Pubblicato in: | Beilstein J Nanotechnol |
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| Autori principali: | , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Beilstein-Institut
2019
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6633814/ https://ncbi.nlm.nih.gov/pubmed/31355102 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.10.132 |
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