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A robust nitridation technique for fabrication of disordered superconducting TiN thin films featuring phase slip events
Disorder induced phase slip (PS) events appearing in the current voltage characteristics (IVCs) are reported for two-dimensional TiN thin films produced by a robust substrate mediated nitridation technique. Here, high temperature annealing of Ti/Si(3)N(4) based metal/substrate assembly is the key to...
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| 出版年: | Sci Rep |
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| 主要な著者: | , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Publishing Group UK
2021
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8042045/ https://ncbi.nlm.nih.gov/pubmed/33846407 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-021-86819-6 |
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