A robust nitridation technique for fabrication of disordered superconducting TiN thin films featuring phase slip events

Disorder induced phase slip (PS) events appearing in the current voltage characteristics (IVCs) are reported for two-dimensional TiN thin films produced by a robust substrate mediated nitridation technique. Here, high temperature annealing of Ti/Si(3)N(4) based metal/substrate assembly is the key to...

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Publicat a:Sci Rep
Autors principals: Yadav, Sachin, Kaushik, Vinay, Saravanan, M. P., Aloysius, R. P., Ganesan, V., Sahoo, Sangeeta
Format: Artigo
Idioma:Inglês
Publicat: Nature Publishing Group UK 2021
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Article
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC8042045/
https://ncbi.nlm.nih.gov/pubmed/33846407
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-021-86819-6
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