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A robust nitridation technique for fabrication of disordered superconducting TiN thin films featuring phase slip events
Disorder induced phase slip (PS) events appearing in the current voltage characteristics (IVCs) are reported for two-dimensional TiN thin films produced by a robust substrate mediated nitridation technique. Here, high temperature annealing of Ti/Si(3)N(4) based metal/substrate assembly is the key to...
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| Pubblicato in: | Sci Rep |
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| Autori principali: | , , , , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Nature Publishing Group UK
2021
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8042045/ https://ncbi.nlm.nih.gov/pubmed/33846407 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-021-86819-6 |
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