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A robust nitridation technique for fabrication of disordered superconducting TiN thin films featuring phase slip events

Disorder induced phase slip (PS) events appearing in the current voltage characteristics (IVCs) are reported for two-dimensional TiN thin films produced by a robust substrate mediated nitridation technique. Here, high temperature annealing of Ti/Si(3)N(4) based metal/substrate assembly is the key to...

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Detalhes bibliográficos
Publicado no:Sci Rep
Main Authors: Yadav, Sachin, Kaushik, Vinay, Saravanan, M. P., Aloysius, R. P., Ganesan, V., Sahoo, Sangeeta
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2021
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC8042045/
https://ncbi.nlm.nih.gov/pubmed/33846407
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-021-86819-6
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