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Impact of device scaling on the electrical properties of MoS(2) field-effect transistors
Two-dimensional semiconducting materials are considered as ideal candidates for ultimate device scaling. However, a systematic study on the performance and variability impact of scaling the different device dimensions is still lacking. Here we investigate the scaling behavior across 1300 devices fab...
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| Foilsithe in: | Sci Rep |
|---|---|
| Main Authors: | , , , , , , , , , , , |
| Formáid: | Artigo |
| Teanga: | Inglês |
| Foilsithe: |
Nature Publishing Group UK
2021
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| Ábhair: | |
| Rochtain Ar Líne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7987965/ https://ncbi.nlm.nih.gov/pubmed/33758215 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-021-85968-y |
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