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speckle-tracking: a software suite for ptychographic X-ray speckle tracking
In recent years, X-ray speckle-tracking techniques have emerged as viable tools for wavefront metrology and sample imaging applications. These methods are based on the measurement of near-field images. Thanks to their simple experimental setup, high angular sensitivity and compatibility with low-coh...
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| Publicat a: | J Appl Crystallogr |
|---|---|
| Autors principals: | , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2020
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7710491/ https://ncbi.nlm.nih.gov/pubmed/33304226 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720011991 |
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