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Towards the Fabrication of High-Aspect-Ratio Silicon Gratings by Deep Reactive Ion Etching

The key optical components of X-ray grating interferometry are gratings, whose profile requirements play the most critical role in acquiring high quality images. The difficulty of etching grating lines with high aspect ratios when the pitch is in the range of a few micrometers has greatly limited im...

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Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:Micromachines (Basel)
Prif Awduron: Shi, Zhitian, Jefimovs, Konstantins, Romano, Lucia, Stampanoni, Marco
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: MDPI 2020
Pynciau:
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC7570153/
https://ncbi.nlm.nih.gov/pubmed/32961900
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/mi11090864
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