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Engineering of impact ionization characteristics in In(0.53)Ga(0.47)As/Al(0.48)In(0.52)As superlattice avalanche photodiodes on InP substrate
We report on engineering impact ionization characteristics of In(0.53)Ga(0.47)As/Al(0.48)In(0.52)As superlattice avalanche photodiodes (InGaAs/AlInAs SL APDs) on InP substrate to design and demonstrate an APD with low k-value. We design InGaAs/AlInAs SL APDs with three different SL periods (4 ML, 6...
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| Vydáno v: | Sci Rep |
|---|---|
| Hlavní autoři: | , , , , , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Nature Publishing Group UK
2020
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7542422/ https://ncbi.nlm.nih.gov/pubmed/33028858 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-73810-w |
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