Instrument-model refinement in normalized reciprocal-vector space for X-ray Laue diffraction

A simple yet efficient instrument-model refinement method for X-ray diffraction data is presented and discussed. The method is based on least-squares minimization of differences between respective normalized (i.e. unit length) reciprocal vectors computed for adjacent frames. The approach was primari...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:J Appl Crystallogr
Hlavní autoři: Kamiński, Radosław, Szarejko, Dariusz, Pedersen, Martin N., Hatcher, Lauren E., Łaski, Piotr, Raithby, Paul R., Wulff, Michael, Jarzembska, Katarzyna N.
Médium: Artigo
Jazyk:Inglês
Vydáno: International Union of Crystallography 2020
Témata:
Research Papers
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC7534537/
https://ncbi.nlm.nih.gov/pubmed/33122973
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720011929
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!

Podobné jednotky