Instrument-model refinement in normalized reciprocal-vector space for X-ray Laue diffraction

A simple yet efficient instrument-model refinement method for X-ray diffraction data is presented and discussed. The method is based on least-squares minimization of differences between respective normalized (i.e. unit length) reciprocal vectors computed for adjacent frames. The approach was primari...

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Publicat a:J Appl Crystallogr
Autors principals: Kamiński, Radosław, Szarejko, Dariusz, Pedersen, Martin N., Hatcher, Lauren E., Łaski, Piotr, Raithby, Paul R., Wulff, Michael, Jarzembska, Katarzyna N.
Format: Artigo
Idioma:Inglês
Publicat: International Union of Crystallography 2020
Matèries:
Research Papers
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC7534537/
https://ncbi.nlm.nih.gov/pubmed/33122973
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720011929
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