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Instrument-model refinement in normalized reciprocal-vector space for X-ray Laue diffraction
A simple yet efficient instrument-model refinement method for X-ray diffraction data is presented and discussed. The method is based on least-squares minimization of differences between respective normalized (i.e. unit length) reciprocal vectors computed for adjacent frames. The approach was primari...
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| Publicado no: | J Appl Crystallogr |
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| Main Authors: | , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2020
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7534537/ https://ncbi.nlm.nih.gov/pubmed/33122973 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720011929 |
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