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Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence
This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, a...
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| Publicado no: | J Synchrotron Radiat |
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| Main Authors: | , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2020
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7467341/ https://ncbi.nlm.nih.gov/pubmed/32876613 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577520009868 |
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