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50-nm-resolution full-field X-ray microscope without chromatic aberration using total-reflection imaging mirrors
X-ray spectromicroscopy with a full-field imaging technique is a powerful method for chemical analysis of heterogeneous complex materials with a nano-scale spatial resolution. For imaging optics, an X-ray reflective optical system has excellent capabilities with highly efficient, achromatic, and lon...
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| 出版年: | Sci Rep |
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| 主要な著者: | , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Publishing Group
2017
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5390314/ https://ncbi.nlm.nih.gov/pubmed/28406227 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep46358 |
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