Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence

This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, a...

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Bibliografski detalji
Izdano u:J Synchrotron Radiat
Glavni autori: Nakamura, Nami, Matsuyama, Satoshi, Inoue, Takato, Inoue, Ichiro, Yamada, Jumpei, Osaka, Taito, Yabashi, Makina, Ishikawa, Tetsuya, Yamauchi, Kazuto
Format: Artigo
Jezik:Inglês
Izdano: International Union of Crystallography 2020
Teme:
Short Communications
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC7467341/
https://ncbi.nlm.nih.gov/pubmed/32876613
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577520009868
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