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Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors
The electrical characteristics of Zinc oxide (ZnO) thin-film transistors are analyzed to apprehend the effects of oxygen vacancies after vacuum treatment. The energy level of the oxygen vacancies was found to be located near the conduction band of ZnO, which contributed to the increase in drain curr...
Gorde:
| Argitaratua izan da: | Nanomaterials (Basel) |
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| Egile Nagusiak: | , , , , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
MDPI
2020
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7353260/ https://ncbi.nlm.nih.gov/pubmed/32570877 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano10061186 |
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