APA citiranje

Kang, S. C., Kim, S. Y., Lee, S. K., Kim, K., Allouche, B., Hwang, H. J., & Lee, B. H. (2020). Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors. Nanomaterials (Basel).

Citação norma Chicago

Kang, Soo Cheol, So Young Kim, Sang Kyung Lee, Kiyung Kim, Billal Allouche, Hyeon Jun Hwang, and Byoung Hun Lee. "Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors." Nanomaterials (Basel) 2020.

MLA citiranje

Kang, Soo Cheol, et al. "Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors." Nanomaterials (Basel) 2020.