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Addressing systematic errors in axial distance measurements in single-emitter localization microscopy
Nanoscale localization of point emitters is critical to several methods in optical fluorescence microscopy, including single-molecule super-resolution imaging and tracking. While the precision of the localization procedure has been the topic of extensive study, localization accuracy has been less em...
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| 出版年: | Opt Express |
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| 主要な著者: | , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Optical Society of America
2020
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7340385/ https://ncbi.nlm.nih.gov/pubmed/32672159 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/OE.391496 |
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