Petrov, P. N., & Moerner, W. E. (2020). Addressing systematic errors in axial distance measurements in single-emitter localization microscopy. Opt Express.
استشهاد بنمط شيكاغوPetrov, Petar N., و W. E. Moerner. "Addressing Systematic Errors in Axial Distance Measurements in Single-emitter Localization Microscopy." Opt Express 2020.
MLA استشهادPetrov, Petar N., و W. E. Moerner. "Addressing Systematic Errors in Axial Distance Measurements in Single-emitter Localization Microscopy." Opt Express 2020.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.