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Study of a hysteresis window of FinFET and fully-depleted silicon-on-insulator (FDSOI) MOSFET with ferroelectric capacitor

In this work, the measured electrical characteristics of a fully depleted silicon-on-insulator (FDSOI) device and fin-shaped field-effect transistor (FinFET), whose gate electrode is connected in series to the bottom electrode of a ferroelectric capacitor (FE-FDSOI/FE-FinFET), are experimentally stu...

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Bibliografske podrobnosti
izdano v:Nano Converg
Main Authors: Yoon, Chankeun, Moon, Seungjun, Shin, Changhwan
Format: Artigo
Jezik:Inglês
Izdano: Springer Singapore 2020
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC7264088/
https://ncbi.nlm.nih.gov/pubmed/32483648
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40580-020-00230-x
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