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Electron Tomography of Pencil-Shaped GaN/(In,Ga)N Core-Shell Nanowires
The three-dimensional structure of GaN/(In,Ga)N core-shell nanowires with multi-faceted pencil-shaped apex is analyzed by electron tomography using high-angle annular dark-field mode in a scanning transmission electron microscope. Selective area growth on GaN-on-sapphire templates using a patterned...
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| Udgivet i: | Nanoscale Res Lett |
|---|---|
| Main Authors: | , , , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Springer US
2019
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6626086/ https://ncbi.nlm.nih.gov/pubmed/31300916 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-019-3072-1 |
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