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Revealing the intrinsic nature of the mid-gap defects in amorphous Ge(2)Sb(2)Te(5)

Understanding the relation between the time-dependent resistance drift in the amorphous state of phase-change materials and the localised states in the band gap of the glass is crucial for the development of memory devices with increased storage density. Here a machine-learned interatomic potential...

詳細記述

保存先:
書誌詳細
出版年:Nat Commun
主要な著者: Konstantinou, Konstantinos, Mocanu, Felix C., Lee, Tae-Hoon, Elliott, Stephen R.
フォーマット: Artigo
言語:Inglês
出版事項: Nature Publishing Group UK 2019
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC6624207/
https://ncbi.nlm.nih.gov/pubmed/31296874
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-019-10980-w
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